Free Huawei H35-560 Practice Test & Real Exam Questions

  • Exam Code/Number: H35-560
  • Exam Name/Title: HCIA-LTE-RNP&RNO V1.0
  • Certification Provider: Huawei
  • Corresponding Certification: HCIA-LTE
  • Exam Questions: 83
  • Updated On: Jul 14, 2026
The insertion loss of the cavity power divider is larger than that of the microstrip power divider.
Correct Answer: A Vote an answer
Which of the following types of warm wires are commonly used? (multiple choices)
Correct Answer: A,B,C Vote an answer
During the test, the bit error rate below 20% is normal.
Correct Answer: A Vote an answer
In the newly-built two-channel indoor sub-system, because LTE uses the MIMO feature, the uplink and downlink rate of the two-channel indoor sub-system is twice that of the single-channel indoor sub-system.
Correct Answer: A Vote an answer
In the drive test process, if RRC re-establishment occurs, it is judged that the random access failure of the UE is caused.
Correct Answer: A Vote an answer
Which of the following descriptions are correct for cross-zone coverage? (Multiple choice)
Correct Answer: A,B,D Vote an answer
Before the cluster optimization test, the target area must be divided into clusters. Which of the following statements are correct? (Multiple choice)
Correct Answer: B,C Vote an answer
The LTE system requires an uplink synchronization system. Uplink synchronization is mainly to eliminate interference between different users in a cell.
Correct Answer: B Vote an answer
If the UE fails to switch, it is mostly characterized by dropped calls, RRC reestablishment, and so on.
Correct Answer: B Vote an answer